Transmission Electron Microscopy (TEM) Suite

Launched in March 2013, this is a commercial service for advanced materials characterisation offering brand new high-resolution TEM system: JEOL 2100 for both external and internal users.

The state-of-the-art instrument features;

• high-resolution Gatan digital camera with resolution 0.2 nm, capable of detailed observation and measurements of crystal lattice
• dark field (HAADF detector) imaging in STEM mode
• 3D tomography with high-stability goniometer stage specifically tuned for high-tilt tomographic applications
• EDS elemental analysis with elemental mapping and line scan capability
• CRYO imaging at -175 oC.

Equipment

Name	Make/Model	Details
TEM Microscope	JEOL JEM-2100 TEM	Morphogical, structural and chemical analysis (nanostructure analysis).