Electron microbeam facility

Our microscope can be used to image objects such as minerals and microfossils at a magnification far exceeding the capabilities of an optical microscope.

The Electron Microbeam facility in the School of Earth and Environmental Sciences houses two Scanning Electron Microscopes and an X-ray Diffractometer. The Scanning Electron Microscope (SEM) is used for characterisation, imaging and analysis of sub-micron features in materials. The X-ray Diffractometer is used for identifying and characterising minerals, either alone or in complex mixtures.

Our facilities include a state-of-the-art Zeiss Sigma HD Field Emission Gun Analytical SEM, which is used for high-resolution imaging and X-ray element mapping, as well as quantitative analysis of major, minor, and trace elements. In addition, our FEI XL30 Field Emission GunEnvironmental SEM is used for high-resolution imaging and semi-quantitative X-ray element analysis of samples. Carbon- and gold-coating facilities are available for non-conducting samples. The Philips PW1710 Automated Powder Diffractometer is used for identifying and characterising minerals, either alone or in complex mixtures.

Our instruments are available to users from all colleges within Cardiff University, as well as other academic institutions and industry partners. Those interested in using the facilities should contact Duncan Muir (MuirD1@cardiff.ac.uk).

Equipment

Name	Make/Model	Details
Zeiss Sigma HD	Carl Zeiss Sigma HD FEG-SEM	In-lens SE, ET-SE, BSE, dual 150mm X-Max EDS, Wave WDS
Zeiss Sigma 300 VP	Carl Zeiss Sigma 300 Variable Pressure FEG-SEM	In-lens SE, ET-SE, BSE, dual UltimMax 65mm EDS, Nordlys EBSD, Plasma cleaner
Agar Carbon Coater	Agar Turbo Carbon Coater	Carbon coater with thickness monitor to coat non-conductive SEM samples
Biorad Sputter Coater	SC500	Sputter coater for adding Au or AuPd coatings to non-conductive SEM samples