Alraziqi, Z., Mukhtar, N. F. H. and Brousseau, E. 2016. Comparison of two AFM probe inspection techniques for three-dimensional tip characterization. Presented at: 16th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2016, University of Nottingham, Nottingham, United Kingdom, 30 May - 3 June 2016 Presented at Bointon, P., Leach, R. K. and Southon, N. eds.Proceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2016. Cranfield, Bedfordshire, UK: euspen pp. 639-646.
Alraziqi, Z., Mukhtar, N. F. H. and Brousseau, E. B. J. 2016. Comparison of two AFM probe inspection techniques for three-dimensional tip characterisation. Presented at: EUSPEN: 16th International Conference & Exhibition, Nottingham, UK, 30 May - 3 June 2016 Presented at Bointon, P., Leach, R. and Southon, N. eds.Proceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology. Bedford: EUSPEN pp. 59-60.
Alraziqi, Z., Mukhtar, N. F. H. and Brousseau, E. 2016. Comparison of two AFM probe inspection techniques for three-dimensional tip characterization. Presented at: 16th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2016, University of Nottingham, Nottingham, United Kingdom, 30 May - 3 June 2016 Presented at Bointon, P., Leach, R. K. and Southon, N. eds.Proceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2016. Cranfield, Bedfordshire, UK: euspen pp. 639-646.
Alraziqi, Z., Mukhtar, N. F. H. and Brousseau, E. B. J. 2016. Comparison of two AFM probe inspection techniques for three-dimensional tip characterisation. Presented at: EUSPEN: 16th International Conference & Exhibition, Nottingham, UK, 30 May - 3 June 2016 Presented at Bointon, P., Leach, R. and Southon, N. eds.Proceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology. Bedford: EUSPEN pp. 59-60.