Transmission Electron Microscopy (TEM) Suite

Launched in March 2013, this is a commercial service for advanced materials characterization offering brand new high-resolution TEM system – JEOL 2100 for both external and internal users.
The state-of-the-art instrument features;
- high-resolution Gatan digital camera with resolution 0.02 nm, capable of detailed observation and measurements of crystal lattice;
- dark field (HAADF detector) imaging in STEM mode;
- 3D tomography with high-stability goniometer stage specifically tuned for high-tilt tomographic applications;
- EDS elemental analysis with elemental mapping and line scan capability;
- CRYO imaging at -175 oC

Offer

Enw	Brand/model	Manylion
TEM Microscope	JEOL JEM-2100 TEM	Morphogical, structural and chemical analysis (nanostructure analysis).