Electron microbeam facility
Imaging and Characterisation of materials in millimetre to nanometre size.
Offer
Enw | Brand/model | Manylion |
---|---|---|
Analytical SEM (Scanning Electron Microscope) | Zeiss NTS S360 SEM with Oxford Instruments INCA Energy Plus | Conventional W filament, high vacuum, scanning electron microscope, calibrated with full set of element standards for analysis of polished material surfaces. Fitted with secondary and backscattered electron detectors and EDX and WDX spectrometers. |
XRD (X-Ray Diffractometer) | Philips PW 1710 and 1840 | Solid and powdered crystaline materials are identified against a database of more than 70,000 recorded phases. Quantification is possible. |
Cysylltwch
Dr Duncan Muir
- muird1@cardiff.ac.uk
- +44 (0)29 2087 5059
Lleoliad
-
Main Building
Plas y Parc
CF10 3AT