Crossbeam platform of Scanning Electron Microscope and Focus Ion Beam

Brand/model	Focused Ion Bean - Zeiss 1540xB
Manylion	SEM and FIB equipped with SE2, InLens, SBED and STEM detectors with additional EDX module. Suitable for imaging, nano and sub micro milling and chemical analysis of no biological objects.
Cyfleuster
Ysgol	Yr Ysgol Peirianneg

Cysylltwch

Queen's Buildings
5 The Parade
Heol Casnewydd
CF24 3AA