Atomic Force Microscope

Brand/model	XE-100S SPM AFM PSIA Atomic force microscope
Manylion	Enables the dimensional and surface roughness measurement of parts having an envelope of a few cm in all 3 dimensions. The resolution is a few nm and the maximum area that can be inspected at once is 45um x 45um
Cyfleuster
Ysgol	Yr Ysgol Peirianneg

Cysylltwch

Queen's Buildings
5 The Parade
Heol Casnewydd
CF24 3AA