Yuwei Wan
Myfyriwr ymchwil,
- wany8@cardiff.ac.uk
- +44 (0)74 1058 4532
- W2.14, Adeiladau'r Frenhines -Adeilad y Gorllewin, 5 The Parade, Heol Casnewydd, Caerdydd, CF24 3AA
Mae'r cynnwys hwn ar gael yn Saesneg yn unig.
Trosolwg
Ymchil
Diddordebau ymchwil
The High Value Manufacturing HVM Group
Goruchwyliaeth
Yr Athro Ying Liu
Senior Lecturer - Teaching and Research
Cyhoeddiadau
2024
- Wan, Y., Liu, Y., Chen, Z., Chen, C., Li, X., Hu, F. and Packianather, M. 2024. Making knowledge graphs work for smart manufacturing: Research topics, applications and prospects. Journal of Manufacturing Systems 76, pp. 103-132. (10.1016/j.jmsy.2024.07.009)
- Chen, Z., Wan, Y., Liu, Y. and Valera Medina, A. 2024. A knowledge graph-supported information fusion approach for
multi-faceted conceptual modelling. Information Fusion 101, article number: 101985. (10.1016/j.inffus.2023.101985)
2023
- Wan, Y., Chen, Z., Liu, Y., Packianather, M. and Wang, R. 2023. Constructing industrial knowledge graph through ontology and link prediction. Presented at: IEEE International Conference on Automation Science and Engineering (CASE), Auckland, New Zealand, 26-29 August 20232023 IEEE 19th International Conference on Automation Science and Engineering (CASE). IEEE pp. 1-6., (10.1109/CASE56687.2023.10260566)
2022
- Xu, M., Zhu, B., Chen, C. and Wan, Y. 2022. On-line recognition of abnormal patterns in bivariate autocorrelated process using random forest. Computers, Materials & Continua 73(1), pp. 1707-1722. (10.32604/cmc.2022.027708)
- Wan, Y., Chen, Z., Hu, F., Liu, Y., Packianather, M. and Wang, R. 2022. Exploiting knowledge graph for multi-faceted conceptual modelling using GCN. Presented at: 3rd International Conference on Industry 4.0 and Smart Manufacturing (ISM 2021), Linz, Austria, 17-19 November 2021, Vol. 200. Procedia Computer Science, Vol 200 pp. 1174-1183., (10.1016/j.procs.2022.01.317)
2021
- Zhang, H., Zhu, B., Pang, K., Chen, C. and Wan, Y. 2021. Identification of abnormal patterns in AR (1) process using CS-SVM. Intelligent Automation and Soft Computing 28(3), pp. 797-810. (10.32604/iasc.2021.017232)