Tescan MAIA-3 Field Emission Gun Scanning Electron Microscope (FEG-SEM)
Mae'r cynnwys hwn ar gael yn Saesneg yn unig.
High resolution Scanning Electron Microscope with X-EDS, EBSD, SE, BSE and STEM.
Features
- High brightness Schottky emitter source for high resolution/high current/low noise imaging. Accelerating voltage 0.01 – 30 kV.
- Secondary Electron (SE), in-beam SE, low kV backscattered electron (BSE), in-beam BSE and Scanning Transmission EM (STEM) imaging capability.
- Oxford Instruments X max 80NT SDD Energy Dispersive X-ray detector (X-EDS) for elemental and chemical analysis, mapping and line-scans using Aztec software.
- Oxford Instruments Nordlys Electron Backscattered Diffraction (EBSD) for crystallographic phase determination and grain boundary characterisation.
- Variable pressure operation to 500 Pa.
- Peltier cooled sample stage to -50o C.
- In chamber plasma cleaner.
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X-EDS mapping of PrBaCoO3 perovskite (ACS Catal. 2020, 10, 10, 5430–5442)
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“Herring bone” hollow carbon nanotube using STEM in Scanning Electron Microscopy.
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Electron Backscatter diffraction of stainless steel surface for crystallite size and phase analysis.
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0.5Wt% Pd-ZSM-5. 7nm particles shown using backscatter detector.
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Secondary Electron image of “coffin”-shaped agglomerated Zeolite.
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Brightfield STEM in Scanning Electron Microscopy of 1%PdC. Showing 1-3 nm particles.
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Variable pressure (1-500Pa) mode for analysis of biological and “wet” samples using peltier cooled cryo stage (-50 – 100oC) – Coriander leaf.
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Video capture for real time imaging and “3D” imaging.
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Video capture for real time imaging and “3D” imaging.
